Parametric FE-approach to flip-chip reliability under various loading conditions. - Bernhard Wunderle; Wolfgang Nüchter; Andreas Schubert; Bernd Michel; Herbert Reichl (Microelectron. Reliab., 2004)

Reliability of SnPb and Pb-free flip-chips under different test conditions. - M. Spraul; Wolfgang Nüchter; A. Möller; Bernhard Wunderle; Bernd Michel (Microelectron. Reliab., 2007)