A patent examining expert system using pattern recognition. - Sang-Sung Park; Won-Gyo Jung; Young-Geun Shin; Dong-Sik Jang (Expert Syst. Appl., 2011)

Patent Registration Prediction Methodology Using Multivariate Statistics. - Won-Gyo Jung; Sang-Sung Park; Dong-Sik Jang (IEICE Trans. Inf. Syst., 2011)