Comparative study of NBTI as a function of Si film orientation and thickness in SOI pMOSFETs. - Sung Jun Jang; Dae Hyun Ka; Chong-Gun Yu; Kwan-Su Kim; Won-Ju Cho; Jong Tae Park 003 (Microelectron. Reliab., 2007)

Electrical Characterization of Nano-Floating Gated Silicon-on-Insulator Memory with In2O3 Nano-Particles Embedded in Polyimide Insulator. - Dong-Uk Lee; Seon Pil Kim; Tae Hee Lee; Eun Kyu Kim; Hyun-Mo Koo; Won-Ju Cho; Young-Ho Kim (IEICE Trans. Electron., 2008)

NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer. - Yong Woo Jeon; Dae Hyun Ka; Chong-Gun Yu; Won-Ju Cho; M. Saif Islam; Jong Tae Park 003 (Microelectron. Reliab., 2009)

NBTI and hot carrier effect of Schottky-barrier p-MOSFETs. - Jin-Young Kim; Jun-Seok Oh; Won-Ju Cho; Jong Tae Park 003 (Microelectron. Reliab., 2010)

Comparative study of electrical instabilities in InGaZnO thin film transistors with gate dielectrics. - Seul Ki Lee; Sung Il Hong; Yeon Ho Lee; Se Won Lee; Won-Ju Cho; Jong Tae Park 003 (Microelectron. Reliab., 2012)

Drain breakdown voltage: A comparison between junctionless and inversion mode p-channel MOSFETs. - Seung-Min Lee; Chong-Gun Yu; Seung Min Jeong; Won-Ju Cho; Jong Tae Park 003 (Microelectron. Reliab., 2012)

Device instability of amorphous InGaZnO thin film transistors with transparent source and drain. - Sang Min Kim; Min-Ju Ahn; Won-Ju Cho; Jong Tae Park 003 (Microelectron. Reliab., 2016)

Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with transparent source and drain. - Jong Hoon Lee; Seul Ki Yu; Jae Won Kim; Min-Ju Ahn; Won-Ju Cho; Jong Tae Park 003 (Microelectron. Reliab., 2016)

Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with ITO local conducting buried layer. - Sang Min Kim; Min-Soo Kang; Won-Ju Cho; Jong Tae Park 003 (Microelectron. Reliab., 2017)

Reliability of amorphous InGaZnO TFTs with ITO local conducting buried layer for BEOL power transistors. - Hyun Jong Kim; Byung Sang Song; Won-Ju Cho; Jong Tae Park 003 (Microelectron. Reliab., 2017)

Effect of microwave annealing on SOI MOSFETs: Post-metal annealing with low thermal budget. - Eun-Ki Hong; Won-Ju Cho (Microelectron. Reliab., 2018)

Effects of the compositional ratios of sputtering target on the device performance and instability in amorphous InGaZnO thin film transistors. - Hee Pyung Park; Sang Woo Kim; Joong-Won Shin; Won-Ju Cho; Jong Tae Park 003 (Microelectron. Reliab., 2018)

Highly Sensitive and Selective Sodium Ion Sensor Based on Silicon Nanowire Dual Gate Field-Effect Transistor. - Seong-Kun Cho; Won-Ju Cho (Sensors, 2021)

Highly Sensitive and Transparent Urea-EnFET Based Point-of-Care Diagnostic Test Sensor with a Triple-Gate a-IGZO TFT. - Seong-Kun Cho; Won-Ju Cho (Sensors, 2021)

Fully Transparent and Sensitivity-Programmable Amorphous Indium-Gallium-Zinc-Oxide Thin-Film Transistor-Based Biosensor Platforms with Resistive Switching Memories. - Hyeong-Un Jeon; Won-Ju Cho (Sensors, 2021)

Pushing the Limits of Biosensing: Selective Calcium Ion Detection with High Sensitivity via High-k Gate Dielectric Engineered Si Nanowire Random Network Channel Dual-Gate Field-Effect Transistors. - Tae-Hwan Hyun; Won-Ju Cho (Sensors, 2023)

Smart pH Sensing: A Self-Sensitivity Programmable Platform with Multi-Functional Charge-Trap-Flash ISFET Technology. - Yeong-Ung Kim; Won-Ju Cho (Sensors, 2024)