Image Enhancement for Automated TFT-LCD Inspection System Using Estimation of Intensity Flow. - Woo-Seob Kim; Jong-Hwan Oh; Chan-Ho Han; Kil-Houm Park (IEICE Trans. Electron., 2007)

Defect Detection of TFT-LCD Image Using Adapted Contrast Sensitivity Function and Wavelet Transform. - Jong-Hwan Oh; Woo-Seob Kim; Chan-Ho Han; Kil-Houm Park (IEICE Trans. Electron., 2007)