EOF: Efficient Built-In Redundancy Analysis Methodology With Optimal Repair Rate. - Myung-Hoon Yang; Hyungjun Cho; Wooheon Kang; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010)

A Die Selection and Matching Method with Two Stages for Yield Enhancement of 3-D Memories. - Wooheon Kang; Changwook Lee; Keewon Cho; Sungho Kang 001 (Asian Test Symposium, 2013)

A New Fuse Architecture and a New Post-Share Redundancy Scheme for Yield Enhancement in 3-D-Stacked Memories. - Changwook Lee; Wooheon Kang; Donkoo Cho; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)

A BIRA for Memories With an Optimal Repair Rate Using Spare Memories for Area Reduction. - Wooheon Kang; Hyungjun Cho; Joohwan Lee; Sungho Kang 001 (IEEE Trans. Very Large Scale Integr. Syst., 2014)

Low power scan bypass technique with test data reduction. - Hyunyul Lim; Wooheon Kang; Sungyoul Seo; Yong Lee 002; Sungho Kang 001 (ISQED, 2015)

A 3 Dimensional Built-In Self-Repair Scheme for Yield Improvement of 3 Dimensional Memories. - Wooheon Kang; Changwook Lee; Hyunyul Lim; Sungho Kang 001 (IEEE Trans. Reliab., 2015)

A Survey of Repair Analysis Algorithms for Memories. - Keewon Cho; Wooheon Kang; Hyungjun Cho; Changwook Lee; Sungho Kang 001 (ACM Comput. Surv., 2016)

A New 3-D Fuse Architecture to Improve Yield of 3-D Memories. - Wooheon Kang; Changwook Lee; Hyunyul Lim; Sungho Kang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016)

Optimized Built-In Self-Repair for Multiple Memories. - Wooheon Kang; Changwook Lee; Hyunyul Lim; Sungho Kang 001 (IEEE Trans. Very Large Scale Integr. Syst., 2016)

Fail Memory Configuration Set for RA Estimation. - Hayoung Lee; Keewon Cho; Sungho Kang 001; Wooheon Kang; Seungtaek Lee; Woosik Jeong (ITC, 2020)