Identifying redundant inter-cell margins and its application to reducing routing congestion. - Woohyun Chung; Seongbo Shim; Youngsoo Shin (DATE, 2015)

Defect Probability of Directed Self-Assembly Lithography: Fast Identification and Post-Placement Optimization. - Seongbo Shim; Woohyun Chung; Youngsoo Shin (ICCAD, 2015)

Redundant via insertion for multiple-patterning directed-self-assembly lithography. - Seongbo Shim; Woohyun Chung; Youngsoo Shin (DAC, 2016)

Redundant via insertion in directed self-assembly lithography. - Woohyun Chung; Seongbo Shim; Youngsoo Shin (DATE, 2016)

Placement optimization for MP-DSAL compliant layout. - Seongbo Shim; Woohyun Chung; Youngsoo Shin (ICICDT, 2016)

Lithography Defect Probability and Its Application to Physical Design Optimization. - Seongbo Shim; Woohyun Chung; Youngsoo Shin (IEEE Trans. Very Large Scale Integr. Syst., 2017)

Integrated Latch Placement and Cloning for Timing Optimization. - Jinwook Jung; Gi-Joon Nam; Woohyun Chung; Youngsoo Shin (ACM Trans. Design Autom. Electr. Syst., 2019)

Design of a Waveguide Calibration Kit Consisting of Offset Shorts for Low Measurement Uncertainty. - Chihyun Cho; Jae-Yong Kwon; Tae-Weon Kang; Hyunji Koo; Woohyun Chung (IEEE Access, 2024)

Evaluation of Random Errors for Vector Network Analyzers Based on a Residual Model. - Chihyun Cho; Tae-Weon Kang; Hyunji Koo; Woohyun Chung (IEEE Trans. Instrum. Meas., 2024)

A New Short-Shim-Thru Calibration Method to Replace SOLT in Waveguide Measurement Systems. - Chihyun Cho; Hyunji Koo; Woohyun Chung; Sangsu Lee (IEEE Trans. Instrum. Meas., 2025)