A Fast Built-in Redundancy Analysis for Memories With Optimal Repair Rate Using a Line-Based Search Tree. - Woosik Jeong; Ilkwon Kang; Kyowon Jin; Sungho Kang (IEEE Trans. Very Large Scale Integr. Syst., 2009)

An Advanced BIRA for Memories With an Optimal Repair Rate and Fast Analysis Speed by Using a Branch Analyzer. - Woosik Jeong; Joohwan Lee; Taewoo Han; Kaangchil Lee; Sungho Kang (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010)

Fail Memory Configuration Set for RA Estimation. - Hayoung Lee; Keewon Cho; Sungho Kang 001; Wooheon Kang; Seungtaek Lee; Woosik Jeong (ITC, 2020)

Novel Eye Diagram Estimation Technique to Assess Signal Integrity in High-Speed Memory Test. - Youngsu Oh; Dongmin Han; Byeongseon Go; Seungtaek Lee; Woosik Jeong (ITC, 2020)