Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications. - Junho Kang; Woosol Han; Suhwan Kim 001; Jaehoon Jun (IEEE Trans. Instrum. Meas., 2025)

Corrections to "Comprehensive Analysis of Design and Performance Evaluation Methodologies for a High-Resolution Read-Out IC With Ultralow 1/ f Corner for DC Measurement Applications". - Junho Kang; Woosol Han; Suhwan Kim 001; Jaehoon Jun (IEEE Trans. Instrum. Meas., 2025)