The Sampling-Based Sensitivity Analysis Model for Yield Improvement in HDD Manufacturing. - Worraluk Yamwong; Jhaggapong Kaotien; Tiranee Achalakul (CISIS, 2009)

Yield improvement analysis with parameter-screening factorials. - Worraluk Yamwong; Tiranee Achalakul (Appl. Soft Comput., 2012)