Statistical Compact Modeling With Artificial Neural Networks. - Wu Dai; Yu Li; Zhao Rong; Baokang Peng; Lining Zhang; Runsheng Wang; Ru Huang 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2023)

When Device Modeling Meets Machine Learning: Opportunities and Challenges (Invited). - Lining Zhang; Baokang Peng; Yu Li; Hengyi Liu; Wu Dai; Runsheng Wang (MLCAD, 2024)