Comparison of stochastic response surface method and Monte Carlo method for uncertainty analysis of electronics prognostics. - Wuyang Pan; Zili Wang 002; Bo Sun 002 (ICPHM, 2015)

Envelope probability and EFAST-based sensitivity analysis method for electronic prognostic uncertainty quantification. - Bo Sun 002; Wuyang Pan; Zili Wang 002; Kam-Chuen Yung (Microelectron. Reliab., 2015)