Evaluation of the Degradation on a COTS Linear CCD Induced by Total Ionizing Dose Radiation Damage. - Zujun Wang; Baoping He; Wuying Ma; Zhibin Yao; Shaoyan Huang; Minbo Liu; Jiangkun Sheng (J. Sensors, 2016)

Research on proton radiation effects on CMOS image sensors with experimental and particle transport simulation methods. - Yuanyuan Xue; Zujun Wang; Minbo Liu; Baoping He; Zhibin Yao; Jiangkun Sheng; Wuying Ma; Guantao Dong; Junshan Jin (Sci. China Inf. Sci., 2017)

Proton Radiation Effects on Dark Signal Distribution of PPD CMOS Image Sensors: Both TID and DDD Effects. - Yuanyuan Xue; Zujun Wang; Wei Chen 153; Minbo Liu; Baoping He; Zhibin Yao; Jiangkun Sheng; Wuying Ma; Guantao Dong; Junshan Jin (Sensors, 2017)

Modeling dark signal of CMOS image sensors irradiated by reactor neutron using Monte Carlo method. - Yuanyuan Xue; Zujun Wang; Wei Chen 153; Baoping He; Zhibin Yao; Minbo Liu; Jiangkun Sheng; Wuying Ma; Guantao Dong; Junshan Jin (Sci. China Inf. Sci., 2018)

Comparison of the dark signal degradation induced by Gamma ray, proton, and neutron radiation in pinned photodiode CMOS image sensors. - Zujun Wang; Yuanyuan Xue; Wei Chen 153; Rui Xu; Hao Ning; Baoping He; Zhibin Yao; Minbo Liu; Jiangkun Sheng; Wuying Ma; Guantao Dong (Sci. China Inf. Sci., 2019)

Impact of thermal baking before radiation on the total dose response of bipolar device. - Wuying Ma; Xiaoping Ouyang 001; Hongxia Guo; Pei Li; Baoping He; Zujun Wang; Shilong Gou; Yuanyuan Xue (Microelectron. J., 2023)

The Total Ionizing Dose Effects on Perovskite CsPbBr3 Semiconductor Detector. - Wuying Ma; Linyue Liu; Haoming Qin; Runlong Gao; Baoping He; Shilong Gou; Yihui He; Xiaoping Ouyang 001 (Sensors, 2023)

Effect of 60Coγ ray radiation on electrical properties of SiGe HBTs at low temperatures. - Yahui Feng; Hongxia Guo; Wuying Ma; Jiawen Hu; Xiaoping Ouyang 003; Jinxin Zhang; Fengqi Zhang; Hong Zhang; Ruxue Bai; Xiaohua Ma 001; Yue Hao 001 (Microelectron. J., 2024)

Synergistic Radiation Effects in PPD CMOS Image Sensors Induced by Neutron Displacement Damage and Gamma Ionization Damage. - Zujun Wang; Yuanyuan Xue; Ning Tang; Gang Huang; Xu Nie; Shan-Kun Lai; Baoping He; Wuying Ma; Jiangkun Sheng; Shilong Gou (Sensors, 2024)