Characterising the surface roughness of AFM grown SiO2 on Si. - Daniel Hill; X. Blasco; Marc Porti; Montserrat Nafría; Xavier Aymerich (Microelectron. Reliab., 2001)

Local current fluctuations before and after breakdown of thin SiO2 films observed with conductive atomic force microscope. - Marc Porti; X. Blasco; Montserrat Nafría; Xavier Aymerich; Alexander Olbrich; Bernd Ebersberger (Microelectron. Reliab., 2001)

Conduction and Breakdown Behaviour of Atomic Force Microscopy Grown SiO2 Gate Oxide on MOS Structures. - X. Blasco; Montserrat Nafría; Xavier Aymerich (Microelectron. Reliab., 2002)

Breakdown spots of ultra-thin (EOT<1.5nm) HfO2/SiO2 stacks observed with enhanced - CAFM. - X. Blasco; Montserrat Nafría; Xavier Aymerich; J. Pétry; Wilfried Vandervorst (Microelectron. Reliab., 2005)