New qualification approach for optoelectronic components. - Jean-Luc Goudard; P. Berthier; X. Boddaert; Dominique Laffitte; J. Périnet (Microelectron. Reliab., 2002)

Reliability of optoelectronics components: towards new qualification practices. - Jean-Luc Goudard; X. Boddaert; J. Périnet; Dominique Laffitte (Microelectron. Reliab., 2003)