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Hydrogen in MOSFETs - A primary agent of reliability issues. - Sokrates T. Pantelides; L. Tsetseris; Sergey N. Rashkeev; X. J. Zhou; Daniel M. Fleetwood; Ronald D. Schrimpf (Microelectron. Reliab., 2007)

Performance, reliability, radiation effects, and aging issues in microelectronics - from atomic-scale physics to engineering-level modeling. - Sokrates T. Pantelides; L. Tsetseris; M. J. Beck; Sergey N. Rashkeev; G. Hadjisavvas; I. G. Batyrev; B. R. Tuttle; A. G. Marinopoulos; X. J. Zhou; Daniel M. Fleetwood; Ronald D. Schrimpf (ESSCIRC, 2009)

Fast preparation of Bell state and W state with Rydberg superatom. - Yan-qiang Ji; Y. L. Liu; H. Li; X. J. Zhou; R. J. Xiao; Li Dong 002; Xiao-Ming Xiu (Quantum Inf. Process., 2020)

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