Field-effect control of breakdown paths in HfO2 based MIM structures. - X. Saura; X. Lian; David Jiménez; Enrique Miranda 002; Xavier Borrisé; Francesca Campabadal; Jordi Suñé (Microelectron. Reliab., 2013)

Direct observation of the generation of breakdown spots in MIM structures under constant voltage stress. - X. Saura; D. Moix; Jordi Suñé; Paul K. Hurley; Enrique Miranda 002 (Microelectron. Reliab., 2013)