Polysilicon oxide quality optimization at Wafer level of a Bipolar/CMOS/DMOS technology. - Xavier Gagnard; Yannick Rey-Tauriac; Olivier Bonnaud (Microelectron. Reliab., 2001)

Reliability improvement of high value doped polysilicon-based resistors. - E. Carvou; F. Le Bihan; Anne Claire Salaün; R. Rogel; Olivier Bonnaud; Yannick Rey-Tauriac; Xavier Gagnard; L. Roland (Microelectron. Reliab., 2002)

3D integration technology for set-top box application. - David Henry; Séverine Cheramy; Jean Charbonnier; Pascal Chausse; Muriel Neyret; Cathy Brunet-Manquat; Sophie Verrun; Nicolas Sillon; Laurent Bonnot; Xavier Gagnard; E. Saugier (3DIC, 2009)