An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors. - Xhesila Xhafa; Ali Dogus Güngördü; Didem Erol; Yavuzhan Yavuz; Mustafa Berke Yelten (IEEE Trans. Instrum. Meas., 2021)

Learning-Based Characterization Models for Quality Assurance of Emerging Memory Technologies. - Xhesila Xhafa; Patrick Girard 001; Arnaud Virazel (ETS, 2023)

On Using Cell-Aware Methodology for SRAM Bit Cell Testing. - Xhesila Xhafa; Aymen Ladhar; Eric Faehn; Lorena Anghel; Gregory di Pendina; Patrick Girard 001; Arnaud Virazel (ETS, 2023)

A Structural Testing Approach for SRAM Address Decoders Using Cell-Aware Methodology. - Xhesila Xhafa; Eric Faehn; Patrick Girard 001; Arnaud Virazel (DFT, 2024)

Producing a Bidirectional ATPG Compliant Verilog-HDL Memory Model of SRAM. - D. Ronga; Xhesila Xhafa; Eric Faehn; Patrick Girard 001; Thibault Vayssade; Arnaud Virazel (DTTIS, 2024)

A Graph-Based Methodology for Speeding up Cell-Aware Model Generation. - Gianmarco Mongelli; Xhesila Xhafa; Eric Faehn; Dylan Robins; Patrick Girard 001; Arnaud Virazel (IOLTS, 2024)

A Runtime Efficient Graph-Based Cell-Aware Model Generation for Structural SRAM Testing. - Gianmarco Mongelli; Xhesila Xhafa; Eric Faehn; Dylan Robins; Patrick Girard 001; Arnaud Virazel (IOLTS, 2025)

A Digital SRAM Modeling for Cell-Aware Testing and Test Algorithms Evaluation. - D. Ronga; Xhesila Xhafa; Eric Faehn; Patrick Girard 001; T. Vayssade; Arnaud Virazel (IOLTS, 2025)

SRAM Periphery Testing Using the Cell-Aware Test Methodology. - Xhesila Xhafa; Eric Faehn; Patrick Girard 001; Arnaud Virazel (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2025)