Stress-Aware Design Methodology. - Victor Moroz; Lee Smith; Xi-Wei Lin; Dipu Pramanik; Greg Rollins (ISQED, 2006)

Layout Proximity Effects and Modeling Alternatives for IC Designs. - Xi-Wei Lin; Victor Moroz (IEEE Des. Test Comput., 2010)

Modeling and Optimization of Advanced 3D NAND Memory. - Mehdi Saremi; Ashish Pal; Liu Jiang; El Mehdi Bazizi; Helen Lee; Xi-Wei Lin; Blessy Alexander; Buvna Ayyagari-Sangamalli (DRC, 2020)

Modeling and Simulation for DRAM and Flash Memory Technology Exploration and Development. - Xi-Wei Lin; Salvatore M. Amoroso; Ko-Hsin Lee; Meng Hsuan Ke; Tue Gunst; Pavel Tikhomirov; Plamen Asenov (IMW, 2024)

Modeling of Negative Bias Temperature Instability (NBTI) for Gate-All-Around (GAA) Stacked Nanosheet Technology. - Leitao Liu; Jingtian Fang; Ashish Pal; Plamen Asenov; Mohit Bajaj; Bei Deng; Xi-Wei Lin; Souvik Mahapatra; Subi Kengeri; El Mehdi Bazizi (IRPS, 2024)

3DIC System-Technology Co-Optimization with a Focus on the Interplay of Thermal, Power, Timing, and Stress Effects. - Victor Moroz; Xiaopeng Xu; Alexei Svizhenko; Xi-Wei Lin; Sergey Popov; Henry Sheng; Kenneth Larsen (VLSI Technology and Circuits, 2024)