Sensitivity and Reliability Evaluation for Mixed-Signal ICs under Electromigration and Hot-Carrier Effects. - Xiangdong Xuan; Abhijit Chatterjee (DFT, 2001)

IC Reliability Simulator ARET and Its Application in Design-for-Reliability. - Xiangdong Xuan; Abhijit Chatterjee; Adit D. Singh; Namsoo P. Kim; Mark T. Chisa (Asian Test Symposium, 2003)

Application of local design-for-reliability techniques for reducing wear-out degradation of CMOS combinational logic circuits. - Xiangdong Xuan; Abhijit Chatterjee; Adit D. Singh (ETS, 2004)

Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects. - Xiangdong Xuan; Adit D. Singh; Abhijit Chatterjee (J. Electron. Test., 2006)