Characterizing the Reliability and Threshold Voltage Shifting of 3D Charge Trap NAND Flash. - Weihua Liu; Fei Wu 005; Meng Zhang 014; Yifei Wang; Zhonghai Lu; Xiangfeng Lu; Changsheng Xie (DATE, 2019)

Characterization Summary of Performance, Reliability, and Threshold Voltage Distribution of 3D Charge-Trap NAND Flash Memory. - Weihua Liu; Fei Wu 005; Xiang Chen; Meng Zhang 014; Yu Wang 168; Xiangfeng Lu; Changsheng Xie (ACM Trans. Storage, 2022)