Enhanced reliability of hexagonal boron nitride dielectric stacks due to high thermal conductivity. - Xianhu Liang; Bin Yuan; Yuanyuan Shi; Fei Hui; Xu Jing; Mario Lanza; Felix Palumbo (IRPS, 2018)

Tristate Resistive Switching in Heterogenous Van Der Waals Dielectric Structures. - Kaichen Zhu; Xianhu Liang; Bin Yuan; Marco A. Villena; Chao Wen; Tao Wang; Shaochuan Chen; Mario Lanza; Fei Hui; Yuanyuan Shi (IRPS, 2019)