Low-cost high-quality constant offset injection for SEIR-based ADC built-in-self-test. - Xiankun Jin; Nan Sun 003 (ISCAS, 2014)

An on-chip ADC BIST solution and the BIST enabled calibration scheme. - Xiankun Jin; Tao Chen 006; Mayank Jain; Arun Kumar Barman; David Kramer; Doug Garrity; Randall L. Geiger; Degang Chen 001 (ITC, 2017)

USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test. - Tao Chen 006; Xiankun Jin; Randall L. Geiger; Degang Chen 001 (IEEE Trans. Circuits Syst. I Regul. Pap., 2018)

Fast Gate Leakage Current Monitor With Large Dynamic Range. - Kushagra Bhatheja; Xiankun Jin; Matthew R. Strong; Degang Chen 001 (IEEE Trans. Circuits Syst. II Express Briefs, 2021)

Low Cost High Accuracy Stimulus Generator for On-chip Spectral Testing. - Kushagra Bhatheja; Shravan K. Chaganti; Degang Chen 001; Xiankun Robert Jin; Chris C. Dao; Juxiang Ren; Abhishek Kumar; Daniel Correa; Mark Lehmann; Thomas Rodriguez; Eric Kingham; Joel R. Knight; et al. (ITC, 2022)

Enhanced ML-Based Approach for Functional Safety Improvement in Automotive AMS Circuits. - Ayush Arunachalam; Sanjay Das; Monikka Rajan; Fei Su; Xiankun Jin; Suvadeep Banerjee; Arnab Raha; Suriyaprakash Natarajan; Kanad Basu (ITC, 2023)

Innovation Practices Track: Silicon Lifecycle Management Challenges and Opportunities. - Fei Su; Xiankun Robert Jin; Nilanjan Mukherjee 001; Yervant Zorian (VTS, 2023)

Enhancing Functional Safety in Automotive AMS Circuits through Unsupervised Machine Learning. - Ayush Arunachalam; Ian Kintz; Suvadeep Banerjee; Arnab Raha; Xiankun Jin; Fei Su; Viswanathan Pillai Prasanth; Rubin A. Parekhji; Suriyaprakash Natarajan; Kanad Basu (CoRR, 2024)

Matching Critical Analog Circuit Components Up To Third-Order Gradients for All Possible Exact Matching Ratios. - Michael Sekyere; Isaac Bruce; Ruohan Yang; Degang Chen 001; Colin C. McAndrew; Xiankun Jin; Chen He; Doug Garrity (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2025)