Affordable High Throughput Field Detection of Wheat Stripe Rust Using Deep Learning with Semi-Automated Image Labeling. - Zhou Tang; Meinan Wang; Michael Schirrmann; Karl-Heinz Dammer; Xianran Li; Robert Brueggeman; Sindhuja Sankaran; Arron H. Carter; Michael O. Pumphrey; Yang Hu; Xianming Chen; Zhiwu Zhang 001 (Comput. Electron. Agric., 2023)

Deep neural networks autonomously learn and utilize critical environmental conditions to capture the impacts of weather on spring wheat performance. - Ryan L. Benke; Linqian Han; Kimberly A. Garland-Campbell; Xianran Li (Comput. Electron. Agric., 2025)