Novel ATPG algorithms for transition faults. - Xiao Liu 010; Michael S. Hsiao; Sreejit Chakravarty; Paul J. Thadikaran (ETW, 2002)

Techniques to Reduce Data Volume and Application Time for Transition Test. - Xiao Liu 010; Michael S. Hsiao; Sreejit Chakravarty; Paul J. Thadikaran (ITC, 2002)

Constrained ATPG for Broadside Transition Testing. - Xiao Liu 010; Michael S. Hsiao (DFT, 2003)

Efficient Transition Fault ATPG Algorithms Based on Stuck-At Test Vectors. - Xiao Liu 010; Michael S. Hsiao; Sreejit Chakravarty; Paul J. Thadikaran (J. Electron. Test., 2003)

On identifying functionally untestable transition faults. - Xiao Liu 010; Michael S. Hsiao (HLDVT, 2004)

ATPG and DFT Algorithms for Delay Fault Testing. - Xiao Liu 010 (2004)

A Novel Transition Fault ATPG That Reduces Yield Loss. - Xiao Liu 010; Michael S. Hsiao (IEEE Des. Test Comput., 2005)

Efficient techniques for transition testing. - Xiao Liu 010; Michael S. Hsiao; Sreejit Chakravarty; Paul J. Thadikaran (ACM Trans. Design Autom. Electr. Syst., 2005)