On Reusing Test Access Mechanisms for Debug Data Transfer in SoC Post-Silicon Validation. - Xiao Liu 011; Qiang Xu 001 (ATS, 2008)

On capture power-aware test data compression for scan-based testing. - Jia Li 022; Xiao Liu 011; Yubin Zhang; Yu Hu 001; Xiaowei Li 001; Qiang Xu 001 (ICCAD, 2008)

A Generic Framework for Scan Capture Power Reduction in Test Compression Environment. - Xiao Liu 011; Feng Yuan; Qiang Xu 001 (ITC, 2008)

Interconnection fabric design for tracing signals in post-silicon validation. - Xiao Liu 011; Qiang Xu 001 (DAC, 2009)

Trace signal selection for visibility enhancement in post-silicon validation. - Xiao Liu 011; Qiang Xu 001 (DATE, 2009)

A generic framework for scan capture power reduction in fixed-length symbol-based test compression environment. - Xiao Liu 011; Qiang Xu 001 (DATE, 2009)

On simultaneous shift- and capture-power reduction in linear decompressor-based test compression environment. - Xiao Liu 011; Qiang Xu 001 (ITC, 2009)

Trace signal selection for debugging electrical errors in post-silicon validation. - Xiao Liu 011; Qiang Xu 001 (ITC, 2009)

On signal tracing in post-silicon validation. - Qiang Xu 001; Xiao Liu 011 (ASP-DAC, 2010)

On Signal Tracing for Debugging Speedpath-Related Electrical Errors in Post-Silicon Validation. - Xiao Liu 011; Qiang Xu 001 (Asian Test Symposium, 2010)

Layout-aware pseudo-functional testing for critical paths considering power supply noise effects. - Xiao Liu 011; Yubin Zhang; Feng Yuan; Qiang Xu 001 (DATE, 2010)

On multiplexed signal tracing for post-silicon debug. - Xiao Liu 011; Qiang Xu 001 (DATE, 2011)

On High-Quality Test Pattern Selection and Manipulation. - Feng Yuan; Xiao Liu 011; Qiang Xu 001 (ETS, 2011)

Pseudo-functional testing for small delay defects considering power supply noise effects. - Feng Yuan; Xiao Liu 011; Qiang Xu 001 (ICCAD, 2011)

Capture-power-aware test data compression using selective encoding. - Jia Li 022; Xiao Liu 011; Yubin Zhang; Yu Hu 001; Xiaowei Li 001; Qiang Xu 001 (Integr., 2011)

X-tracer: a reconfigurable X-tolerant trace compressor for silicon debug. - Feng Yuan; Xiao Liu 011; Qiang Xu 001 (DAC, 2012)

On efficient silicon debug with flexible trace interconnection fabric. - Xiao Liu 011; Qiang Xu 001 (ITC, 2012)

On Signal Selection for Visibility Enhancement in Trace-Based Post-Silicon Validation. - Xiao Liu 011; Qiang Xu 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

On X-Variable Filling and Flipping for Capture-Power Reduction in Linear Decompressor-Based Test Compression Environment. - Xiao Liu 011; Qiang Xu 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

On Multiplexed Signal Tracing for Post-Silicon Validation. - Xiao Liu 011; Qiang Xu 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013)

Trace-Based Post-Silicon Validation for VLSI Circuits - Xiao Liu 011; Qiang Xu 001 (Springer, 2014)