MAC controller for Wireless Sensor Network on IEEE 802.15.4 standard. - Meng Zhang; Chenhao Wang; Xiao Shi 001; Hao Liu; Huacheng Zhu (ICSPCS, 2012)

A fast and robust failure analysis of memory circuits using adaptive importance sampling method. - Xiao Shi 001; Fengyuan Liu; Jun Yang 006; Lei He 001 (DAC, 2018)

Adaptive Low-Rank Tensor Approximation for SRAM Yield Analysis using Bootstrap Resampling. - Xiao Shi 001; Jinlong Yan; Hao Yan 002; Jiajia Zhang; Jinxin Wang; Longxing Shi; Lei He 001 (ASICON, 2019)

Meta-Model based High-Dimensional Yield Analysis using Low-Rank Tensor Approximation. - Xiao Shi 001; Hao Yan 002; Qiancun Huang; Jiajia Zhang; Longxing Shi; Lei He 001 (DAC, 2019)

Efficient Yield Analysis for SRAM and Analog Circuits using Meta-Model based Importance Sampling Method. - Xiao Shi 001; Hao Yan 002; Jiajia Zhang; Qiancun Huang; Longxing Shi; Lei He 001 (ICCAD, 2019)

Adaptive Clustering and Sampling for High-Dimensional and Multi-Failure-Region SRAM Yield Analysis. - Xiao Shi 001; Hao Yan 002; Jinxin Wang; Xiaofen Xu; Fengyuan Liu; Longxing Shi; Lei He 001 (ISPD, 2019)

TYMER: A Yield-based Performance Model for Timing-speculation SRAM. - Shan Shen; Liang Pang; Tianxiang Shao; Ming Ling; Xiao Shi 001; Longxing Shi (DAC, 2020)

A Non-Gaussian Adaptive Importance Sampling Method for High-Dimensional and Multi-Failure-Region Yield Analysis. - Xiao Shi 001; Hao Yan 002; Chuwen Li; Jianli Chen; Longxing Shi; Lei He 001 (ICCAD, 2020)

An Efficient Adaptive Importance Sampling Method for SRAM and Analog Yield Analysis. - Xiao Shi 001; Hao Yan 002; Jinxin Wang; Jiajia Zhang; Longxing Shi; Lei He 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020)

An Adaptive Delay Model for Timing Yield Estimation under Wide-Voltage Range. - Hao Yan 002; Xiao Shi 001; Chengzhen Xuan; Peng Cao 002; Longxing Shi (ASP-DAC, 2021)

A Compact High-Dimensional Yield Analysis Method using Low-Rank Tensor Approximation. - Xiao Shi 001; Hao Yan 002; Qiancun Huang; Chengzhen Xuan; Lei He 001; Longxing Shi (ACM Trans. Design Autom. Electr. Syst., 2022)

A Novel Delay Calibration Method Considering Interaction between Cells and Wires. - Leilei Jin; Jiajie Xu; Wenjie Fu 003; Hao Yan 002; Xiao Shi 001; Ming Ling; Longxing Shi (DATE, 2023)

Token Packing for Transformers with Variable-Length Inputs. - Tiandong Zhao; Siyuan Miao; Shaoqiang Lu; Jialin Cao; Jun Qiu; Xiao Shi 001; Kun Wang 005; Lei He 001 (FPL, 2023)

An efficient SRAM yield analysis method based on scaled-sigma adaptive importance sampling with meta-model accelerated. - Liang Pang; Ziqi Wang; Rui Shi; Mengyun Yao; Xiao Shi 001; Hao Yan 002; Longxin Shi (Integr., 2023)

CharTM: The dynamic stability characterization for memory based on tail distribution modeling. - Liang Pang; Mengyun Yao; Xiao Shi 001; Hao Yan 002; Longxin Shi (Microelectron. J., 2023)

LVF2: A Statistical Timing Model based on Gaussian Mixture for Yield Estimation and Speed Binning. - Junzhuo Zhou; Li Huang; Haoxuan Xia; Yihui Cai; Leilei Jin; Xiao Shi 001; Wei W. Xing; Ting-Jung Lin; Lei He 001 (DAC, 2024)

High-Dimensional Yield Analysis Using Sparse Representation for Long-Tailed Distribution. - Ziqi Wang; Weihan Sun; Zhongxi Guo; Xiao Shi 001; Longxing Shi (MLCAD, 2024)

Efficient Memory Circuits Yield Analysis and Optimization Framework via Meta-Learning. - Ziqi Wang; Liang Pang; Xiao Shi 001; Longxing Shi (IEEE Trans. Circuits Syst. II Express Briefs, 2024)

A Novel Cross-Perturbation for Single Domain Generalization. - Dongjia Zhao; Lei Qi 001; Xiao Shi 001; Yinghuan Shi; Xin Geng 001 (IEEE Trans. Circuits Syst. Video Technol., 2024)

Robust optimization algorithm of RF MEMS switches considering uncertainties. - Hao Yan 002; Yaning Jia; Chuangyuan Zeng; Xiaoping Liao; Xiao Shi 001 (Integr., 2025)