Determination of cut-off time of accelerated aging test under temperature stress for LED lamps. - Jian Hao; Lei Jing; Hong-liang Ke; Yao Wang; Qun Gao; Xiao-xun Wang; Qiang Sun; Zhi-jun Xu (Frontiers Inf. Technol. Electron. Eng., 2017)

Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps. - Jian Hao; Lei Jing; Hong-liang Ke; Yao Wang; Qun Gao; Xiao-xun Wang; Qiang Sun; Zhi-jun Xu (Frontiers Inf. Technol. Electron. Eng., 2017)

The Influence of Junction Temperature Variation of LED on the Lifetime Estimation During Accelerated Aging Test. - Xiao-xun Wang; Lei Jing; Yao Wang; Qun Gao; Qiang Sun (IEEE Access, 2019)