Methods of Controlling Lift-Off in Conductivity Invariance Phenomenon for Eddy Current Testing. - Zhongwen Jin; Yuwei Meng; Rongdong Yu; Ruochen Huang; Mingyang Lu; Hanyang Xu 003; Xiaobai Meng; Qian Zhao 013; Zhijie Zhang 001; Anthony J. Peyton; Wuliang Yin (IEEE Access, 2020)

Analysis of Tilt Effect on Notch Depth Profiling Using Thin-Skin Regime of Driver-Pickup Eddy-Current Sensor. - Mingyang Lu; Xiaobai Meng; Ruochen Huang; Anthony J. Peyton; Wuliang Yin (Sensors, 2021)

Evaluation of Coating Thickness Using Lift-Off Insensitivity of Eddy Current Sensor. - Xiaobai Meng; Mingyang Lu; Wuliang Yin; Abdeldjalil Bennecer; Katherine J. Kirk (Sensors, 2021)

Thickness Measurement of Metallic Film Based on a High-Frequency Feature of Triple-Coil Electromagnetic Eddy Current Sensor. - Mingyang Lu; Liming Chen; Xiaobai Meng; Ruochen Huang; Anthony J. Peyton; Wuliang Yin (IEEE Trans. Instrum. Meas., 2021)

Measuring Lift-Off Distance and Electromagnetic Property of Metal Using Dual-Frequency Linearity Feature. - Mingyang Lu; Xiaobai Meng; Ruochen Huang; Liming Chen; Anthony J. Peyton; Wuliang Yin (IEEE Trans. Instrum. Meas., 2021)

Liftoff Tolerant Pancake Eddy-Current Sensor for the Thickness and Spacing Measurement of Nonmagnetic Plates. - Mingyang Lu; Xiaobai Meng; Ruochen Huang; Liming Chen; Anthony J. Peyton; Wuliang Yin (IEEE Trans. Instrum. Meas., 2021)

Inversion of Distance and Magnetic Permeability Based on Material-Independent and Liftoff Insensitive Algorithms Using Eddy Current Sensor. - Mingyang Lu; Xiaobai Meng; Ruochen Huang; Liming Chen; Anthony J. Peyton; Wuliang Yin (IEEE Trans. Instrum. Meas., 2021)

Determination of Surface Crack Orientation Based on Thin-Skin Regime Using Triple-Coil Drive-Pickup Eddy-Current Sensor. - Mingyang Lu; Xiaobai Meng; Ruochen Huang; Liming Chen; Zezhi Tang; Junshi Li; Anthony J. Peyton; Wuliang Yin (IEEE Trans. Instrum. Meas., 2021)

Inversion of Lift-Off Distance and Thickness for Nonmagnetic Metal Using Eddy Current Testing. - Xiaobai Meng; Mingyang Lu; Wuliang Yin; Abdeldjalil Bennecer; Katherine J. Kirk (IEEE Trans. Instrum. Meas., 2021)