The Investigation of Negative Capacitance Vertical Nanowire FETs Based on SPICE Model at Device-Circuit Level. - Weixing Huang; Huilong Zhu; Kunpeng Jia; Zhenhua Wu; Xiaogen Yin; Qiang Huo; Yongkui Zhang (CoRR, 2020)

Investigation of negative DIBL effect for ferroelectric-based FETs to improve MOSFETs and CMOS circuits. - Weixing Huang; Huilong Zhu; Yongkui Zhang; Zhenhua Wu; Kunpeng Jia; Xiaogen Yin; Yangyang Li; Chen Li; Xuezheng Ai; Qiang Huo; Junfeng Li (Microelectron. J., 2021)