Learning based decomposition for polarmetric SAR images. - Chu He; Qian Feng; Ming Liu; Xiaonian Liu; Mingsheng Liao (IGARSS, 2011)

A learning-based target decomposition method using Kernel KSVD for polarimetric SAR image classification. - Chu He; Ming Liu; Zixian Liao; Bo Shi; Xiaonian Liu; Xin Xu 005; Mingsheng Liao (EURASIP J. Adv. Signal Process., 2012)

A macro SPICE model for 2-bits/cell split-gate flash memory cell. - Xiaonian Liu; Yiran Xu; Xiangquan Fan; Mengxing Liao; Pingliang Li; Shichang Zou (Microelectron. J., 2017)

Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs. - Lihua Dai; Xiaonian Liu; Mengying Zhang; Leqing Zhang; Zhiyuan Hu; Dawei Bi; Zhengxuan Zhang; Shichang Zou (Microelectron. Reliab., 2017)

Influences of silicon-rich shallow trench isolation on total ionizing dose hardening and gate oxide integrity in a 130 nm partially depleted SOI CMOS technology. - Lei Song; Zhiyuan Hu; Mengying Zhang; Xiaonian Liu; Lihua Dai; Zhengxuan Zhang; Shichang Zou (Microelectron. Reliab., 2017)

A novel highly reliable and low-power radiation hardened SRAM bit-cell design. - Dianpeng Lin; Yiran Xu; Xiaonian Liu; Wenyi Zhu; Lihua Dai; Mengying Zhang; Xiaoyun Li; Xin Xie; Jianwei Jiang 001; Huilong Zhu; Zhengxuan Zhang; Shichang Zou (IEICE Electron. Express, 2018)

Electrical performance of 130 nm PD-SOI MOSFET with diamond layout. - Xiaonian Liu; Lihua Dai; Pingliang Li; Shichang Zou (Microelectron. J., 2020)

An Investigation of Process Variations and Mismatch Characteristics of Vertical Bipolar Junction Transistors. - Xiaonian Liu; Zichen Yang (IEEE Access, 2023)

S-ANN: Synchronous TCAD device simulation of FinFET using Artificial Neural Network. - Yansen Liu; Xiaonian Liu; Ying Zhou; Peng Cao (Microelectron. J., 2025)