A new lifetime prediction method for hot-carrier degradation in n-MOSFETs with ultrathin gate oxides under Vg=Vd. - Fuchen Mu; Mingzhen Xu; Changhua Tan; Xiaorong Duan (Microelectron. Reliab., 2001)

Weibull characteristics of n-MOSFET's with ultrathin gate oxides under FN stress and lifetime prediction. - Fuchen Mu; Mingzhen Xu; Changhua Tan; Xiaorong Duan (Microelectron. Reliab., 2002)

An anomaly detection method of encrypted traffic based on user behavior. - Xin Gong; Xixi Zhao; Haoguang Xin; Liang Gu; Yaning Meng; Xin Ma; Chenni Dong; Xiaorong Duan; Haichuan Sun; Liguo Wang 001 (ICCIR, 2021)