An On-Chip Test Clock Control Scheme for Multi-Clock At-Speed Testing. - Xiaoxin Fan; Yu Hu 001; Laung-Terng Wang (ATS, 2007)

The design-for-testability features of a general purpose microprocessor. - Da Wang; Xiaoxin Fan; Xiang Fu 007; Hui Liu; Ke Wen; Rui Li; Huawei Li 001; Yu Hu 001; Xiaowei Li 001 (ITC, 2007)

Localized random access scan: Towards low area and routing overhead. - Yu Hu 001; Xiang Fu 007; Xiaoxin Fan; Hideo Fujiwara (ASP-DAC, 2008)

On Using Design Partitioning to Reduce Diagnosis Memory Footprint. - Xiaoxin Fan; Huaxing Tang; Sudhakar M. Reddy; Wu-Tung Cheng; Brady Benware (Asian Test Symposium, 2011)

Max-Fill: A method to generate high quality delay tests. - Xiaoxin Fan; Sudhakar M. Reddy; Irith Pomeranz (DDECS, 2011)

Genetic algorithm based approach for segmented testing. - Xiaoxin Fan; Sudhakar M. Reddy; Senling Wang; Seiji Kajihara; Yasuo Sato (DSN Workshops, 2011)

Diagnosis of Cell Internal Defects with Multi-cycle Test Patterns. - Xiaoxin Fan; Manish Sharma; Wu-Tung Cheng; Sudhakar M. Reddy (Asian Test Symposium, 2012)

Improved volume diagnosis throughput using dynamic design partitioning. - Xiaoxin Fan; Huaxing Tang; Yu Huang 005; Wu-Tung Cheng; Sudhakar M. Reddy; Brady Benware (ITC, 2012)

Distributed dynamic partitioning based diagnosis of scan chain. - Yu Huang 005; Xiaoxin Fan; Huaxing Tang; Manish Sharma; Wu-Tung Cheng; Brady Benware; Sudhakar M. Reddy (VTS, 2013)

C-Testing of AI Accelerators *. - Arjun Chaudhuri; Chunsheng Liu; Xiaoxin Fan; Krishnendu Chakrabarty (ATS, 2020)

C-Testing and Efficient Fault Localization for AI Accelerators. - Arjun Chaudhuri; Chunsheng Liu; Xiaoxin Fan; Krishnendu Chakrabarty (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)