Single event transient mitigation in cache memory using transient error checking circuits. - Xiaoyin Yao; Lawrence T. Clark; Dan W. Patterson; Keith E. Holbert (CICC, 2010)

In-situ characterization and extraction of SRAM variability. - Srivatsan Chellappa; Jia Ni; Xiaoyin Yao; Nathan D. Hindman; Jyothi Velamala; Min Chen 024; Yu Cao 001; Lawrence T. Clark (DAC, 2010)

A Low Power, High Performance Threshold Logic-Based Standard Cell Multiplier in 65 nm CMOS. - Samuel Leshner; Krzysztof S. Berezowski; Xiaoyin Yao; Gayathri Chalivendra; Saurabh Patel; Sarma B. K. Vrudhula (ISVLSI, 2010)

The impact of terrestrial radiation effects on the reliability of a smart grid. - Xiaoyin Yao; Hui Ni; G. Alonzo Vera (ISGT, 2012)