Error Rate-Based Log-Likelihood Ratio Processing for Low-Density Parity-Check Codes in DNA Storage. - Xiaozhou Lu; Jaeho Jeong; Jae-Won Kim; Jong-Seon No; Hosung Park; Albert No; Sunghwan Kim 001 (IEEE Access, 2020)

Design of Nonbinary Error Correction Codes With a Maximum Run-Length Constraint to Correct a Single Insertion or Deletion Error for DNA Storage. - Xiaozhou Lu; Sunghwan Kim 001 (IEEE Access, 2021)

New Construction of Balanced Codes Based on Weights of Data for DNA Storage. - Xiaozhou Lu; Sunghwan Kim 001 (IEEE Trans. Emerg. Top. Comput., 2023)

Weakly mutually uncorrelated codes with maximum run length constraint for DNA storage. - Xiaozhou Lu; Sunghwan Kim 001 (Comput. Biol. Medicine, 2023)