A numerical calibration of structure-function transient thermal measurement based on Cauer RC network. - Kun Bai; Shiwei Feng 001; Xuan Li; Shijie Pan; Xiaozhuang Lu; Zhihong Feng; Yamin Zhang (Microelectron. J., 2023)

Automatic in-situ measurement of thermal resistance for GaN HEMTs. - Zhanwu Yao; Shiwei Feng 001; Xuan Li; Kun Bai; Xiaozhuang Lu; Binyu You; Shijie Pan; Yamin Zhang (Microelectron. J., 2024)

A Trap Characterization System for GaN HEMTs Based on Transient Drain Voltage. - Shijie Pan; Shiwei Feng 001; Xuan Li; Kun Bai; Xiaozhuang Lu; Xiang Zheng; Zixuan Feng; Yamin Zhang (IEEE Trans. Instrum. Meas., 2024)

Workload variation compensation optimization of ring oscillator temperature measurement method and its application in field-programmable gate array. - Yaning Wang; Shiwei Feng 001; Xianliang Lv; Kun Bai; Shijie Pan; Zixuan Feng; Xiaozhuang Lu; Yinqi Zhou; Boyang Zhang (Microelectron. J., 2025)

Trapping Behaviors in CNTFETs: Measurement and Analysis of Time Constant, Energy Level, and Trap Location Based on Transient Drain Current. - Shijie Pan; Hui Zhu; Shiwei Feng 001; Yang Yang; Chao Xu; Shuai Huo; Xiaozhuang Lu; Yamin Zhang; Kun Bai (IEEE Trans. Instrum. Meas., 2025)