Response of Switching Hole Traps in the Small-Area P-MOSFET Under Channel Hot-Hole Effect. - Xin Ju 003; Diing Shenp Ang (IRPS, 2019)

Gate-Oxide Trapping Enabled Synaptic Logic Transistor. - Xin Ju 003; Diing Shenp Ang (IRPS, 2020)

Alteration of Gate-Oxide Trap Capture/Emission Time Constants by Channel Hot-Carrier Effect in the Metal-Oxide-Semiconductor Field-Effect Transistor. - Xin Ju 003; Diing Shenp Ang (IEEE Access, 2020)