3-D simulation study of single event effects of SiGe heterojunction bipolar transistor in extreme environment. - Jinxin Zhang; Chaohui He; Hongxia Guo; Du Tang; Cen Xiong; Pei Li; Xin Wang 141 (Microelectron. Reliab., 2015)

Investigation of enhanced low dose rate sensitivity in SiGe HBTs by 60Co γ irradiation under different biases. - Jinxin Zhang; Qi Guo 007; Hongxia Guo; Wu Lu; Chaohui He; Xin Wang 141; Pei Li; Lin Wen (Microelectron. Reliab., 2018)

Degradation Mechanisms of Gate Leakage in GaN-Based HEMTs at Low Dose Rate Irradiation. - Xiaolong Li; Xin Wang 141; Mohan Liu; Kunfeng Zhu; Guohua Shui; Qiwen Zheng; Jiangwei Cui; Wu Lu; Yudong Li; Qi Guo 007 (IEEE Access, 2024)