A 0.44V-1.1V 9-transistor transition-detector and half-path error detection technique for low power applications. - Xinchao Shang; Weiwei Shan; Longxing Shi; Xing Wan; Jun Yang 006 (A-SSCC, 2017)

A 0.46V-1.1V Transition-Detector with In-Situ Timing-Error Detection and Correction Based on Pulsed-Latch Design in AES Accelerator. - Xinchao Shang; Weiwei Shan; Jiaming Xu; Minyi Lu; Yiming Xiang; Longxing Shi; Jun Yang 006 (A-SSCC, 2018)

Design and Implementation of a Reconfigurable Cryptographic Coprocessor with Multiple Side-Channel Attacks Countermeasures. - Xinchao Shang; Weiwei Shan; Xinning Liu (J. Circuits Syst. Comput., 2018)

HTD: A Light-Weight Holosymmetrical Transition Detector for Wide-Voltage-Range Variation Resilient ICs. - Wentao Dai; Weiwei Shan; Xinchao Shang; Xinning Liu; Hao Cai 001; Jun Yang 006 (IEEE Trans. Circuits Syst. I Regul. Pap., 2018)

Timing Error Prediction AVFS With Detection Window Tuning for Wide-Operating-Range ICs. - Weiwei Shan; Xinchao Shang; Longxing Shi; Wentao Dai; Jun Yang 006 (IEEE Trans. Circuits Syst. II Express Briefs, 2018)

A Low Overhead, Within-a-Cycle Adaptive Clock Stretching Circuit With Wide Operating Range in 40-nm CMOS. - Weiwei Shan; Liang Wan; Xinning Liu; Xinchao Shang; Wentao Dai; Shuai Shao; Jun Yang 006; Longxing Shi (IEEE Trans. Circuits Syst. II Express Briefs, 2018)

A Wide-Voltage-Range Half-Path Timing Error-Detection System With a 9-Transistor Transition-Detector in 40-nm CMOS. - Weiwei Shan; Xinchao Shang; Xing Wan; Hao Cai 001; Chuan Zhang 001; Jun Yang 006 (IEEE Trans. Circuits Syst. I Regul. Pap., 2019)

An Energy-Efficient Time-Domain Binary Neural Network Accelerator with Error-Detection in 28nm CMOS. - Yuxuan Du; Xinchao Shang; Weiwei Shan (APCCAS, 2020)

A Wide-Voltage-Range Transition-Detector With In-Situ Timing-Error Detection and Correction Based on Pulsed-Latch Design in 28 nm CMOS. - Xinchao Shang; Minyi Lu; Chengjun Wu; Yiming Xiang; Jiaming Xu; Weiwei Shan (IEEE Trans. Circuits Syst., 2020)

A Time-Domain Binary CNN Engine With Error-Detection-Based Resilience in 28nm CMOS. - Zhikuang Cai; Boyang Cheng; Yuxuan Du; Xinchao Shang; Weiwei Shan (IEEE Trans. Circuits Syst. II Express Briefs, 2021)