The effect of silicon films impurity compensation on the performance of silicon drift detector. - Wei Luo; Rui Jia; Longjie Wang; Chunlin Guo; Shuai Jiang; Xiaorang Tian; Xiaoping Ouyang 001; Xing Li 019 (Microelectron. J., 2023)

Effect of bias conditions on transient anode current for quasi-double-sided silicon drift detector with high energy resolution. - Longjie Wang; Wei Luo; Mingpeng Zhang; Rui Jia; Xiaorang Tian; Bolong Wang; Shuai Jiang; Jiawang Cheng; Xiaoping Ouyang 001; Xing Li 019 (Microelectron. J., 2023)