Fast Detection Technology of Abnormal Out-of-Tolerance Meters Based on Fit Model Theory. - Hao Chen; Xingang Du; Chuning Peng; Jing Liu (J. Circuits Syst. Comput., 2024)

Abnormal User Identification in Substation Area Based on Restricted Ridge Regression Model. - Xingang Du; Bing Zhao; Dehui Ge; Yajie Li (J. Circuits Syst. Comput., 2024)