A Module Area Estimator for VLSI Layout. - Xinghao Chen 003; Michael L. Bushnell (DAC, 1988)

Dynamic State and Objective Learning for Sequential Circuit Automatic Test Generation Using Decomposition Equivalence. - Xinghao Chen 003; Michael L. Bushnell (FTCS, 1994)

Generation of search state equivalence for automatic test pattern generation. - Xinghao Chen 003; Michael L. Bushnell (VLSI Design, 1995)

Sequential circuit test generation using dynamic justification equivalence. - Xinghao Chen 003; Michael L. Bushnell (J. Electron. Test., 1996)