Multi-Feature Shuffle Algorithm for Root Cause Detection in Semiconductor Manufacturing. - Ding Tan; Xingyu Xu 002; Kaixiang Yu; Sihai Zhang; Tianchi Chen (DASC/PiCom/CBDCom/CyberSciTech, 2021)

How Feature Remove and Shuffle Work in Key Feature Detection? The Perspective of NDER. - Xingyu Xu 002; Ding Tan; Sihai Zhang; Tianchi Chen (DASC/PiCom/CBDCom/CyberSciTech, 2021)

The Predictability of Stock Price: Empirical Study onTick Data in Chinese Stock Market. - Yueshan Chen; Xingyu Xu 002; Tian Lan; Sihai Zhang (CoRR, 2023)

The Predictability of Stock Price: Empirical Study on Tick Data in Chinese Stock Market. - Yueshan Chen; Xingyu Xu 002; Tian Lan; Sihai Zhang (Big Data Res., 2024)