A Reliable and Economical Test Method for Semiconductor Device Aging. - Xinhuan Yang; Qianqian Sang; Chuanzheng Wang; Shuo Wang; Liang Wang; Yuanfu Zhao (APCCAS, 2022)

A Study of the States Kinetics in NBTI and HCI Degradation based on TCAD. - Xinhuan Yang; Mingyan Yu; Xingyu Fang; Liang Wang; Chuanzheng Wang; Yuanfu Zhao (EEET, 2023)