Error Analysis of the Combined-Scan High-Speed Atomic Force Microscopy. - Lu Liu 005; Ming Kong; Sen Wu 001; Xinke Xu; Daodang Wang (Sensors, 2021)

Review of Highlight Suppression Methods for Structured Light 3D Measurement. - Jiangwen Tang; Xinke Xu; Yuanhui Peng; Liang Xue; Kaiqiang Xie (ICGSP, 2022)