Testability measure with reconvergent fanout analysis and its applications. - Xinli Gu; Krzysztof Kuchcinski; Zebo Peng (Microprocessing and Microprogramming, 1991)

An approach to testability analysis and improvement for VLSI systems. - Xinli Gu; Krzysztof Kuchcinski; Zebo Peng (Microprocess. Microprogramming, 1992)

Testability analysis and improvement from VHDL behavioral specifications. - Xinli Gu; Krzysztof Kuchcinski; Zebo Peng (EURO-DAC, 1994)

An Efficient and Economic Partitioning Approach for Testability. - Xinli Gu; Krzysztof Kuchcinski; Zebo Peng (ITC, 1995)

RT level testability-driven partitioning. - Xinli Gu (VTS, 1995)

A controller testability analysis and enhancement technique. - Xinli Gu; Erik Larsson; Krzysztof Kuchcinski; Zebo Peng (ED&TC, 1997)

A new approach to scan chain reordering using physical design information. - Mokhtar Hirech; James Beausang; Xinli Gu (ITC, 1998)

An effort-minimized logic BIST implementation method. - Xinli Gu; Sung Soo Chung; Frank Tsang; Jan Arild Tofte; Hamid Rahmanian (ITC, 2001)

Re-Using DFT Logic for Functional and Silicon Debugging Test. - Xinli Gu; Weili Wang; Kevin Li; Heon C. Kim; Sung Soo Chung (ITC, 2002)

Realizing High Test Quality Goals with Smart Test Resource Usage. - Xinli Gu; Cyndee Wang; Abby Lee; Bill Eklow; Kun-Han Tsai; Jan Arild Tofte; Mark Kassab; Janusz Rajski (ITC, 2004)

At-Speed Interconnect Test and Diagnosis of External Memories on a System. - Heon C. Kim; Hong Shin Jun; Xinli Gu; Sung Soo Chung (ITC, 2004)

A practical perspective on reducing ASIC NTFs. - Zoe Conroy; Geoff Richmond; Xinli Gu; Bill Eklow (ITC, 2005)

Design for Board and System Level Structural Test and Diagnosis. - Toai Vo; Zhiyuan Wang; Ted Eaton; Pradipta Ghosh; Huai Li; Young Lee; Weili Wang; Hong Shin Jun; Rong Fang; Dan Singletary; Xinli Gu (ITC, 2006)

VirtualScan: Test Compression Technology Using Combinational Logic and One-Pass ATPG. - Laung-Terng Wang; Xiaoqing Wen; Shianling Wu; Zhigang Wang; Zhigang Jiang; Boryau Sheu; Xinli Gu (IEEE Des. Test Comput., 2008)

Physical defect modeling for fault insertion in system reliability test. - Zhaobo Zhang; Zhanglei Wang; Xinli Gu; Krishnendu Chakrabarty (ITC, 2009)

Mimicking of Functional State Space with Structural Tests for the Diagnosis of Board-Level Functional Failures. - Hongxia Fang; Zhiyuan Wang; Xinli Gu; Krishnendu Chakrabarty (Asian Test Symposium, 2010)

Optimization and Selection of Diagnosis-Oriented Fault-Insertion Points for System Test. - Zhaobo Zhang; Zhanglei Wang; Xinli Gu; Krishnendu Chakrabarty (Asian Test Symposium, 2010)

Board-level fault diagnosis using an error-flow dictionary. - Zhaobo Zhang; Zhanglei Wang; Xinli Gu; Krishnendu Chakrabarty (ITC, 2010)

Board-level fault diagnosis using Bayesian inference. - Zhaobo Zhang; Zhanglei Wang; Xinli Gu; Krishnendu Chakrabarty (VTS, 2010)

Deterministic test for the reproduction and detection of board-level functional failures. - Hongxia Fang; Zhiyuan Wang; Xinli Gu; Krishnendu Chakrabarty (ASP-DAC, 2011)

Ranking of Suspect Faulty Blocks Using Dataflow Analysis and Dempster-Shafer Theory for the Diagnosis of Board-Level Functional Failures. - Hongxia Fang; Zhiyuan Wang; Xinli Gu; Krishnendu Chakrabarty (ETS, 2011)

The gap: Test challenges in Asia manufacturing field. - Xinli Gu (ITC, 2011)

Smart diagnosis: Efficient board-level diagnosis and repair using artificial neural networks. - Zhaobo Zhang; Krishnendu Chakrabarty; Zhanglei Wang; Zhiyuan Wang; Xinli Gu (ITC, 2011)

Session Summary II: Dependable VLSI for Product Reliability. - Xinli Gu (Asian Test Symposium, 2012)

Session Summary V: Is Component Interconnection Test Enough for Board or System Test. - Xinli Gu (Asian Test Symposium, 2012)

In-Field Testing of NAND Flash Storage: Why and How? - Yu Hu 001; Xinli Gu; Xiaowei Li 001 (Asian Test Symposium, 2012)

Adaptive Board-Level Functional Fault Diagnosis Using Decision Trees. - Fangming Ye; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (Asian Test Symposium, 2012)

Board-Level Functional Fault Diagnosis Using Learning Based on Incremental Support-Vector Machines. - Fangming Ye; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (Asian Test Symposium, 2012)

Re-using chip level DFT at board level. - Xinli Gu; Jeff Rearick; Bill Eklow; Martin Keim; Jun Qian; Artur Jutman; Krishnendu Chakrabarty; Erik Larsson (ETS, 2012)

Diagnostic system based on support-vector machines for board-level functional diagnosis. - Zhaobo Zhang; Xinli Gu; Yaohui Xie; Zhiyuan Wang; Zhanglei Wang; Krishnendu Chakrabarty (ETS, 2012)

Are industrial test problems real problems? I thought research has resolved them all! - Xinli Gu (ITC, 2012)

Reproduction and Detection of Board-Level Functional Failure. - Hongxia Fang; Krishnendu Chakrabarty; Zhiyuan Wang; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Diagnosis of Board-Level Functional Failures Under Uncertainty Using Dempster-Shafer Theory. - Hongxia Fang; Krishnendu Chakrabarty; Zhiyuan Wang; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Physical-Defect Modeling and Optimization for Fault-Insertion Test. - Zhaobo Zhang; Zhanglei Wang; Xinli Gu; Krishnendu Chakrabarty (IEEE Trans. Very Large Scale Integr. Syst., 2012)

Handling Missing Syndromes in Board-Level Functional-Fault Diagnosis. - Fangming Ye; Shi Jin 001; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (Asian Test Symposium, 2013)

Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? - Said Hamdioui; Davide Appello; Arnaud Grasset; Xinli Gu; Bram Kruseman; Riccardo Mariani; Hermann Obermeir; Srikanth Venkataraman (ETS, 2013)

Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis. - Fangming Ye; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (ETS, 2013)

AgentDiag: An agent-assisted diagnostic framework for board-level functional failures. - Zelong Sun; Li Jiang 002; Qiang Xu 001; Zhaobo Zhang; Zhiyuan Wang; Xinli Gu (ITC, 2013)

Board-Level Functional Fault Diagnosis Using Artificial Neural Networks, Support-Vector Machines, and Weighted-Majority Voting. - Fangming Ye; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013)

Knowledge discovery and knowledge transfer in board-level functional fault diagnosis. - Fangming Ye; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (ITC, 2014)

Special session 8B - Panel: In-field testing of SoC devices: Which solutions by which players? - Jacob A. Abraham; Xinli Gu; Teresa MacLaurin; Janusz Rajski; Paul G. Ryan; Dimitris Gizopoulos; Matteo Sonza Reorda (VTS, 2014)

Information-Theoretic Framework for Evaluating and Guiding Board-Level Functional-Fault Diagnosis. - Fangming Ye; Krishnendu Chakrabarty; Zhaobo Zhang; Xinli Gu (IEEE Des. Test, 2014)

Board-Level Functional Fault Diagnosis Using Multikernel Support Vector Machines and Incremental Learning. - Fangming Ye; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)

On test syndrome merging for reasoning-based board-level functional fault diagnosis. - Zelong Sun; Li Jiang 002; Qiang Xu 001; Zhaobo Zhang; Zhiyuan Wang; Xinli Gu (ASP-DAC, 2015)

Self-learning and adaptive board-level functional fault diagnosis. - Fangming Ye; Krishnendu Chakrabarty; Zhaobo Zhang; Xinli Gu (ASP-DAC, 2015)

Information-Theoretic Syndrome Evaluation, Statistical Root-Cause Analysis, and Correlation-Based Feature Selection for Guiding Board-Level Fault Diagnosis. - Fangming Ye; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015)

Accurate anomaly detection using correlation-based time-series analysis in a core router system. - Shi Jin 001; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (ITC, 2016)

Efficient Board-Level Functional Fault Diagnosis With Missing Syndromes. - Shi Jin 001; Fangming Ye; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016)

Adaptive Board-Level Functional Fault Diagnosis Using Incremental Decision Trees. - Fangming Ye; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016)

RetroDMR: Troubleshooting non-deterministic faults with retrospective DMR. - Ting Wang 008; Yannan Liu; Qiang Xu 001; Zhaobo Zhang; Zhiyuan Wang; Xinli Gu (DATE, 2017)

Data-driven fault diagnosis with missing syndromes imputation for functional test through conditional specification. - Tong Guan; Zhaobo Zhang; Wen Dong 001; Chunming Qiao; Xinli Gu (ETS, 2017)

Changepoint-based anomaly detection in a core router system. - Shi Jin 001; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (ITC, 2017)

Symbol-based health-status analysis in a core router system. - Shi Jin 001; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (ITC, 2017)

Failure prediction based on anomaly detection for complex core routers. - Shi Jin 001; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (ICCAD, 2018)

Self-Learning Health-Status Analysis for a Core Router System. - Shi Jin 001; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (ITC, 2018)

Toward Predictive Fault Tolerance in a Core-Router System: Anomaly Detection Using Correlation-Based Time-Series Analysis. - Shi Jin 001; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018)

Knowledge Transfer in Board-Level Functional Fault Identification using Domain Adaptation. - Mengyun Liu; Xin Li 001; Krishnendu Chakrabarty; Xinli Gu (ITC, 2019)

Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model. - Renjian Pan; Zhaobo Zhang; Xin Li 001; Krishnendu Chakrabarty; Xinli Gu (VTS, 2019)

IP Session on Machine Learning Applications in IC Test-Related Tasks. - Ghada Sokar; Yassin Zakaria; Asmaa Rabie; Kareem Madkour; Ira Leventhal; Jochen Rivoir; Xinli Gu; Haralampos-G. D. Stratigopoulos (VTS, 2019)

Anomaly Detection and Health-Status Analysis in a Core Router System. - Shi Jin 001; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (IEEE Des. Test, 2019)

Changepoint-Based Anomaly Detection for Prognostic Diagnosis in a Core Router System. - Shi Jin 001; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019)

Unsupervised Root-Cause Analysis for Integrated Systems. - Renjian Pan; Zhaobo Zhang; Xin Li 001; Krishnendu Chakrabarty; Xinli Gu (ITC, 2020)

Hierarchical Symbol-Based Health-Status Analysis Using Time-Series Data in a Core Router System. - Shi Jin 001; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020)

Self-Learning and Efficient Health-Status Analysis for a Core Router System. - Shi Jin 001; Zhaobo Zhang; Krishnendu Chakrabarty; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020)

Fine-grained Adaptive Testing Based on Quality Prediction. - Mengyun Liu; Renjian Pan; Fangming Ye; Xin Li 001; Krishnendu Chakrabarty; Xinli Gu (ACM Trans. Design Autom. Electr. Syst., 2020)

Board-Level Functional Fault Identification Using Streaming Data. - Mengyun Liu; Fangming Ye; Xin Li 001; Krishnendu Chakrabarty; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)

Black-Box Test-Cost Reduction Based on Bayesian Network Models. - Renjian Pan; Zhaobo Zhang; Xin Li 001; Krishnendu Chakrabarty; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)

Knowledge Transfer in Board-Level Functional Fault Diagnosis Enabled by Domain Adaptation. - Mengyun Liu; Xin Li 001; Krishnendu Chakrabarty; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)

Unsupervised Two-Stage Root-Cause Analysis for Integrated Systems. - Renjian Pan; Zhaobo Zhang; Xin Li 001; Krishnendu Chakrabarty; Xinli Gu (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)