Remaining Useful Life Prediction Based on an Adaptive Inverse Gaussian Degradation Process With Measurement Errors. - Xudan Chen; Xinli Sun; Xiaosheng Si; Guodong Li (IEEE Access, 2020)

The inverse Gaussian process with a skew-normal distribution as a degradation model. - Xudan Chen; Xinli Sun; Xiong Ding; Jue Tang (Commun. Stat. Simul. Comput., 2020)

Effects of Carbon Impurity in Monocrystalline Silicon on Electrical Properties and the Mechanism Analysis of PIN Rectifier Diodes. - Xinli Sun; Hui Guo; Yuming Zhang; Xingpeng Li; Zhen Cao (IEEE Access, 2021)

Reliability assessment for products with two performance characteristics based on marginal stochastic processes and copulas. - Xudan Chen; Xinli Sun (Commun. Stat. Simul. Comput., 2022)