Optimal Selection of Imperfect Tests for Fault Detection and Isolation. - Shigang Zhang; Krishna R. Pattipati; Zheng Hu; Xisen Wen (IEEE Trans. Syst. Man Cybern. Syst., 2013)

Dynamic Coupled Fault Diagnosis With Propagation and Observation Delays. - Shigang Zhang; Krishna R. Pattipati; Zheng Hu; Xisen Wen; Chaitanya Sankavaram (IEEE Trans. Syst. Man Cybern. Syst., 2013)