Deep Learning-Based Multi-Species Appearance Defect Detection Model for MLCC. - Minjie Du; Meiyun Chen; Xiuhua Cao; Kiyoshi Takamasu (IEEE Trans. Instrum. Meas., 2024)

Machine Vision-Based Lightweight Multiscale Automatic Defect Segmentation Network for MLCC. - Junjie He; Xiuhua Cao; Kiyoshi Takamasu; Meiyun Chen (IEEE Trans. Instrum. Meas., 2024)

Deep Learning for Weak Feature Defect Detection in MLCC Inspection System. - Jialu Wang; Xiuhua Cao; Qianxue Wang; Dawei Zhang; Meiyun Chen (IEEE Trans. Instrum. Meas., 2025)