From Sample Poverty to Rich Feature Learning: A New Metric Learning Method for Few-Shot Classification. - Lei Zhang; Yiting Lin; Xinyu Yang; Tingting Chen; Xiyuan Cheng; Wenbin Cheng (IEEE Access, 2024)

Image privacy protection scheme based on high-quality reconstruction DCT compression and nonlinear dynamics. - Yiting Lin; Zhiyu Xie 003; Tingting Chen; Xiyuan Cheng; Heping Wen (Expert Syst. Appl., 2024)